Surface Physics
MeasLine offers systems for the deposition of thin ceramic coatings exhibiting ferroelectric properties, as well as analytical equipment for surface characterization based on controlled gas partial pressure measurements.
RF Magnetron Sputtering System for Ceramic Coating Deposition
A thin-film deposition system based on magnetron sputtering, equipped with RF-powered magnetrons, enabling the fabrication of ceramic coatings — including perovskite-based layers — with ferroelectric properties.
Apparatus for the study of defect chemistry of solid state
A device for investigating defect chemistry in solid-state materials at high temperatures and under varying gas activities, based on a physical method for controlling the partial pressure of different gases.
Apparatus for the Study of Electro-Degradation and Resistive Switching Phenomena
A dedicated configuration of the defect analysis system enables the investigation of electro-degradation, electro-reduction, and electro-deoxidation processes in crystalline and polycrystalline samples, as a function of electric field strength, temperature, and oxidant activity. The analysis of these processes is essential for understanding material aging, electrochemical degradation, and resistive switching behavior.
Apparatus for Thermal and Electrochemical Desorption Studies
The system enables the investigation of desorption and effusion processes induced by thermal or electrical stimuli. The released desorption products are measured using a quadrupole mass spectrometer. An integral part of the setup is a calibration system that converts pressure changes over time into the absolute number of atoms or molecules removed from the sample during desorption.
System for impedance spectroscopic measurements at high temperature with control of the partial pressure in chamber
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Should you be interested in this type of device, please do not hesitate to contact us.
